Engineering > eBook-PDF > [eBook-PDF] Reliability Prediction for Microelectronics (1st Edition) by Emmanuel Bender ISBN13: 978 (All)
Download [ORG] [eBook-PDF]. Reliability Prediction for Microelectronics (1st Edition) by Emmanuel Bender, Alain Bensoussan, and Joseph B. Bernstein, published by Wiley in 2024. This comprehensive text ... book delves into the principles of reliability physics and the concept of remaining useful life (RUL), providing engineers and researchers with the tools to perform reliability assessments in real operating conditions. The book covers topics such as failure mechanisms, reliability testing, acceleration factor calculation, and multi-physics of failure in deep submicron technologies, including TDDB, EM, HCI, and BTI. It is an essential resource for reliability and quality engineers, design engineers, and advanced engineering students. ISBN: 9781394210930, 1394210930. Categories: Electrical Engineering, Microelectronics, Reliability Engineering, Semiconductor Devices, Electronics Manufacturing. ✅ Lifetime Access | ✅ Instant Download | ✅ Original PDF [Show More]
Last updated: 3 months ago
Preview 5 out of 401 pages
Loading document previews ...
Buy this document to get the full access instantly
Instant Download Access after purchase
Buy NowInstant download
We Accept:
Can't find what you want? Try our AI powered Search
Connected school, study & course
About the document
Uploaded On
Sep 16, 2025
Number of pages
401
Written in
All
This document has been written for:
Uploaded
Sep 16, 2025
Downloads
0
Views
6
Scholarfriends.com Online Platform by Browsegrades Inc. 651N South Broad St, Middletown DE. United States.
We're available through e-mail, Twitter, Facebook, and live chat.
FAQ
Questions? Leave a message!
Copyright © Scholarfriends · High quality services·